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Measurements of Penning-Malmberg trap patch potentials and associated performance degradation

Aled Isaac Orcid Logo, Christopher Baker Orcid Logo, W. Bertsche, A. Capra, C. L. Cesar, Michael Charlton, A. Christensen Orcid Logo, R. Collister, April Cridland Orcid Logo, Stefan Eriksson Orcid Logo, A. Evans, N. Evetts, J. Fajans, T. Friesen, M. C. Fujiwara, D. R. Gill, P. Grandemange, P. Granum, J. S. Hangst, M. E. Hayden, D. Hodgkinson, E. D. Hunter, Christopher Aled Isaac Orcid Logo, M. A. Johnson, Jack Jones, S. A. Jones, S. Jonsell, A. Khramov, L. Kurchaninov, H. Landsberger, Niels Madsen Orcid Logo, Daniel Maxwell Orcid Logo, J. T. K. McKenna, S. Menary, T. Momose, Patrick Mullan, J. J. Munich, K. Olchanski, A. Olin, JOANNA PESZKA, A. Powell, P. Pusa, C.Ø. Rasmussen, F. Robicheaux, R. L. Sacramento, M. Sameed, E. Sarid, D. M. Silveira, C. So, G. Stutter, T. D. Tharp, R. I. Thompson, C. Torkzaban, Dirk van der Werf, E. Ward, J. S. Wurtele, (ALPHA Collaboration)

Physical Review Research, Volume: 6, Issue: 1

Swansea University Authors: Aled Isaac Orcid Logo, Christopher Baker Orcid Logo, Michael Charlton, April Cridland Orcid Logo, Stefan Eriksson Orcid Logo, Christopher Aled Isaac Orcid Logo, Jack Jones, Niels Madsen Orcid Logo, Daniel Maxwell Orcid Logo, Patrick Mullan, JOANNA PESZKA, Dirk van der Werf

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Abstract

Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential...

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Published in: Physical Review Research
ISSN: 2643-1564
Published: American Physical Society (APS) 2024
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URI: https://cronfa.swan.ac.uk/Record/cronfa65508
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Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials&#x2014;variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. 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S.</firstname><surname>Wurtele</surname><order>56</order></author><author><firstname>(ALPHA</firstname><surname>Collaboration)</surname><order>57</order></author></authors><documents><document><filename>65508__29763__da81c5119ab9447eae74902b5f60673d.pdf</filename><originalFilename>65508_VoR.pdf</originalFilename><uploaded>2024-03-20T15:19:44.5670552</uploaded><type>Output</type><contentLength>1721129</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><documentNotes>Released under the terms of the Creative Commons Attribution 4.0 International license.</documentNotes><copyrightCorrect>true</copyrightCorrect><language>eng</language><licence>https://creativecommons.org/licenses/by/4.0/</licence></document></documents><OutputDurs/></rfc1807>
spelling 2024-03-20T15:21:47.3325708 v2 65508 2024-01-24 Measurements of Penning-Malmberg trap patch potentials and associated performance degradation 06d7ed42719ef7bb697cf780c63e26f0 0000-0002-7813-1903 Aled Isaac Aled Isaac true false 0c72afb63bd0c6089fc5b60bd096103e 0000-0002-9448-8419 Christopher Baker Christopher Baker true false d9099cdd0f182eb9a1c8fc36ed94f53f Michael Charlton Michael Charlton true false e3c734cfda1e0b3835968762f39525cc 0000-0003-4361-0266 April Cridland April Cridland true false 785cbd474febb1bfa9c0e14abaf9c4a8 0000-0002-5390-1879 Stefan Eriksson Stefan Eriksson true false 6f6e1ef0e6e5fd7d716a3fbc337da042 NULL Christopher Aled Isaac Christopher Aled Isaac true true a1fd0a804e977beb3835bad353db5f72 Jack Jones Jack Jones true false e348e4d768ee19c1d0c68ce3a66d6303 0000-0002-7372-0784 Niels Madsen Niels Madsen true false e8ebdf12e608884a8d4ea4af35b89b46 0000-0001-5178-9492 Daniel Maxwell Daniel Maxwell true false d5167e8661859aff63e7984b1a421667 Patrick Mullan Patrick Mullan true false d11388181f4f4559514f02e9212c6ca1 JOANNA PESZKA JOANNA PESZKA true false 4a4149ebce588e432f310f4ab44dd82a Dirk van der Werf Dirk van der Werf true false 2024-01-24 BGPS Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations. Journal Article Physical Review Research 6 1 American Physical Society (APS) 2643-1564 16 1 2024 2024-01-16 10.1103/physrevresearch.6.l012008 COLLEGE NANME Biosciences Geography and Physics School COLLEGE CODE BGPS Swansea University Another institution paid the OA fee EPSRC 2024-03-20T15:21:47.3325708 2024-01-24T17:24:46.8017933 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Aled Isaac 0000-0002-7813-1903 1 Christopher Baker 0000-0002-9448-8419 2 W. Bertsche 3 A. Capra 4 C. L. Cesar 5 Michael Charlton 6 A. Christensen 0000-0002-7808-8044 7 R. Collister 8 April Cridland 0000-0003-4361-0266 9 Stefan Eriksson 0000-0002-5390-1879 10 A. Evans 11 N. Evetts 12 J. Fajans 13 T. Friesen 14 M. C. Fujiwara 15 D. R. Gill 16 P. Grandemange 17 P. Granum 18 J. S. Hangst 19 M. E. Hayden 20 D. Hodgkinson 21 E. D. Hunter 22 Christopher Aled Isaac NULL 23 M. A. Johnson 24 Jack Jones 25 S. A. Jones 26 S. Jonsell 27 A. Khramov 28 L. Kurchaninov 29 H. Landsberger 30 Niels Madsen 0000-0002-7372-0784 31 Daniel Maxwell 0000-0001-5178-9492 32 J. T. K. McKenna 33 S. Menary 34 T. Momose 35 Patrick Mullan 36 J. J. Munich 37 K. Olchanski 38 A. Olin 39 JOANNA PESZKA 40 A. Powell 41 P. Pusa 42 C.Ø. Rasmussen 43 F. Robicheaux 44 R. L. Sacramento 45 M. Sameed 46 E. Sarid 47 D. M. Silveira 48 C. So 49 G. Stutter 50 T. D. Tharp 51 R. I. Thompson 52 C. Torkzaban 53 Dirk van der Werf 54 E. Ward 55 J. S. Wurtele 56 (ALPHA Collaboration) 57 65508__29763__da81c5119ab9447eae74902b5f60673d.pdf 65508_VoR.pdf 2024-03-20T15:19:44.5670552 Output 1721129 application/pdf Version of Record true Released under the terms of the Creative Commons Attribution 4.0 International license. true eng https://creativecommons.org/licenses/by/4.0/
title Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
spellingShingle Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
Aled Isaac
Christopher Baker
Michael Charlton
April Cridland
Stefan Eriksson
Christopher Aled Isaac
Jack Jones
Niels Madsen
Daniel Maxwell
Patrick Mullan
JOANNA PESZKA
Dirk van der Werf
title_short Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
title_full Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
title_fullStr Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
title_full_unstemmed Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
title_sort Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
author_id_str_mv 06d7ed42719ef7bb697cf780c63e26f0
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author_id_fullname_str_mv 06d7ed42719ef7bb697cf780c63e26f0_***_Aled Isaac
0c72afb63bd0c6089fc5b60bd096103e_***_Christopher Baker
d9099cdd0f182eb9a1c8fc36ed94f53f_***_Michael Charlton
e3c734cfda1e0b3835968762f39525cc_***_April Cridland
785cbd474febb1bfa9c0e14abaf9c4a8_***_Stefan Eriksson
6f6e1ef0e6e5fd7d716a3fbc337da042_***_Christopher Aled Isaac
a1fd0a804e977beb3835bad353db5f72_***_Jack Jones
e348e4d768ee19c1d0c68ce3a66d6303_***_Niels Madsen
e8ebdf12e608884a8d4ea4af35b89b46_***_Daniel Maxwell
d5167e8661859aff63e7984b1a421667_***_Patrick Mullan
d11388181f4f4559514f02e9212c6ca1_***_JOANNA PESZKA
4a4149ebce588e432f310f4ab44dd82a_***_Dirk van der Werf
author Aled Isaac
Christopher Baker
Michael Charlton
April Cridland
Stefan Eriksson
Christopher Aled Isaac
Jack Jones
Niels Madsen
Daniel Maxwell
Patrick Mullan
JOANNA PESZKA
Dirk van der Werf
author2 Aled Isaac
Christopher Baker
W. Bertsche
A. Capra
C. L. Cesar
Michael Charlton
A. Christensen
R. Collister
April Cridland
Stefan Eriksson
A. Evans
N. Evetts
J. Fajans
T. Friesen
M. C. Fujiwara
D. R. Gill
P. Grandemange
P. Granum
J. S. Hangst
M. E. Hayden
D. Hodgkinson
E. D. Hunter
Christopher Aled Isaac
M. A. Johnson
Jack Jones
S. A. Jones
S. Jonsell
A. Khramov
L. Kurchaninov
H. Landsberger
Niels Madsen
Daniel Maxwell
J. T. K. McKenna
S. Menary
T. Momose
Patrick Mullan
J. J. Munich
K. Olchanski
A. Olin
JOANNA PESZKA
A. Powell
P. Pusa
C.Ø. Rasmussen
F. Robicheaux
R. L. Sacramento
M. Sameed
E. Sarid
D. M. Silveira
C. So
G. Stutter
T. D. Tharp
R. I. Thompson
C. Torkzaban
Dirk van der Werf
E. Ward
J. S. Wurtele
(ALPHA Collaboration)
format Journal article
container_title Physical Review Research
container_volume 6
container_issue 1
publishDate 2024
institution Swansea University
issn 2643-1564
doi_str_mv 10.1103/physrevresearch.6.l012008
publisher American Physical Society (APS)
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics
document_store_str 1
active_str 0
description Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations.
published_date 2024-01-16T05:17:54Z
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score 11.089386