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Measurements of Penning-Malmberg trap patch potentials and associated performance degradation
Physical Review Research, Volume: 6, Issue: 1
Swansea University Authors: Christopher Baker , Michael Charlton, April Cridland , Stefan Eriksson , Christopher Aled Isaac , Jack Jones, Niels Madsen , Daniel Maxwell , Patrick Mullan, JOANNA PESZKA, Dirk van der Werf
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DOI (Published version): 10.1103/physrevresearch.6.l012008
Abstract
Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential...
Published in: | Physical Review Research |
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ISSN: | 2643-1564 |
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American Physical Society (APS)
2024
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URI: | https://cronfa.swan.ac.uk/Record/cronfa65508 |
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Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. 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2024-03-20T15:21:47.3325708 v2 65508 2024-01-24 Measurements of Penning-Malmberg trap patch potentials and associated performance degradation 0c72afb63bd0c6089fc5b60bd096103e 0000-0002-9448-8419 Christopher Baker Christopher Baker true false d9099cdd0f182eb9a1c8fc36ed94f53f Michael Charlton Michael Charlton true false e3c734cfda1e0b3835968762f39525cc 0000-0003-4361-0266 April Cridland April Cridland true false 785cbd474febb1bfa9c0e14abaf9c4a8 0000-0002-5390-1879 Stefan Eriksson Stefan Eriksson true false 6f6e1ef0e6e5fd7d716a3fbc337da042 NULL Christopher Aled Isaac Christopher Aled Isaac true true a1fd0a804e977beb3835bad353db5f72 Jack Jones Jack Jones true false e348e4d768ee19c1d0c68ce3a66d6303 0000-0002-7372-0784 Niels Madsen Niels Madsen true false e8ebdf12e608884a8d4ea4af35b89b46 0000-0001-5178-9492 Daniel Maxwell Daniel Maxwell true false d5167e8661859aff63e7984b1a421667 Patrick Mullan Patrick Mullan true false d11388181f4f4559514f02e9212c6ca1 JOANNA PESZKA JOANNA PESZKA true false 4a4149ebce588e432f310f4ab44dd82a 0000-0001-5436-5214 Dirk van der Werf Dirk van der Werf true false 2024-01-24 EAAS Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations. Journal Article Physical Review Research 6 1 American Physical Society (APS) 2643-1564 16 1 2024 2024-01-16 10.1103/physrevresearch.6.l012008 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University Another institution paid the OA fee EPSRC 2024-03-20T15:21:47.3325708 2024-01-24T17:24:46.8017933 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Christopher Baker 0000-0002-9448-8419 1 W. Bertsche 2 A. Capra 3 C. L. Cesar 4 Michael Charlton 5 A. Christensen 0000-0002-7808-8044 6 R. Collister 7 April Cridland 0000-0003-4361-0266 8 Stefan Eriksson 0000-0002-5390-1879 9 A. Evans 10 N. Evetts 11 J. Fajans 12 T. Friesen 13 M. C. Fujiwara 14 D. R. Gill 15 P. Grandemange 16 P. Granum 17 J. S. Hangst 18 M. E. Hayden 19 D. Hodgkinson 20 E. D. Hunter 21 Christopher Aled Isaac NULL 22 M. A. Johnson 23 Jack Jones 24 S. A. Jones 25 S. Jonsell 26 A. Khramov 27 L. Kurchaninov 28 H. Landsberger 29 Niels Madsen 0000-0002-7372-0784 30 Daniel Maxwell 0000-0001-5178-9492 31 J. T. K. McKenna 32 S. Menary 33 T. Momose 34 Patrick Mullan 35 J. J. Munich 36 K. Olchanski 37 A. Olin 38 JOANNA PESZKA 39 A. Powell 40 P. Pusa 41 C.Ø. Rasmussen 42 F. Robicheaux 43 R. L. Sacramento 44 M. Sameed 45 E. Sarid 46 D. M. Silveira 47 C. So 48 G. Stutter 49 T. D. Tharp 50 R. I. Thompson 51 C. Torkzaban 52 Dirk van der Werf 0000-0001-5436-5214 53 E. Ward 54 J. S. Wurtele 55 (ALPHA Collaboration) 56 65508__29763__da81c5119ab9447eae74902b5f60673d.pdf 65508_VoR.pdf 2024-03-20T15:19:44.5670552 Output 1721129 application/pdf Version of Record true Released under the terms of the Creative Commons Attribution 4.0 International license. true eng https://creativecommons.org/licenses/by/4.0/ |
title |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
spellingShingle |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation Christopher Baker Michael Charlton April Cridland Stefan Eriksson Christopher Aled Isaac Jack Jones Niels Madsen Daniel Maxwell Patrick Mullan JOANNA PESZKA Dirk van der Werf |
title_short |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
title_full |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
title_fullStr |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
title_full_unstemmed |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
title_sort |
Measurements of Penning-Malmberg trap patch potentials and associated performance degradation |
author_id_str_mv |
0c72afb63bd0c6089fc5b60bd096103e d9099cdd0f182eb9a1c8fc36ed94f53f e3c734cfda1e0b3835968762f39525cc 785cbd474febb1bfa9c0e14abaf9c4a8 6f6e1ef0e6e5fd7d716a3fbc337da042 a1fd0a804e977beb3835bad353db5f72 e348e4d768ee19c1d0c68ce3a66d6303 e8ebdf12e608884a8d4ea4af35b89b46 d5167e8661859aff63e7984b1a421667 d11388181f4f4559514f02e9212c6ca1 4a4149ebce588e432f310f4ab44dd82a |
author_id_fullname_str_mv |
0c72afb63bd0c6089fc5b60bd096103e_***_Christopher Baker d9099cdd0f182eb9a1c8fc36ed94f53f_***_Michael Charlton e3c734cfda1e0b3835968762f39525cc_***_April Cridland 785cbd474febb1bfa9c0e14abaf9c4a8_***_Stefan Eriksson 6f6e1ef0e6e5fd7d716a3fbc337da042_***_Christopher Aled Isaac a1fd0a804e977beb3835bad353db5f72_***_Jack Jones e348e4d768ee19c1d0c68ce3a66d6303_***_Niels Madsen e8ebdf12e608884a8d4ea4af35b89b46_***_Daniel Maxwell d5167e8661859aff63e7984b1a421667_***_Patrick Mullan d11388181f4f4559514f02e9212c6ca1_***_JOANNA PESZKA 4a4149ebce588e432f310f4ab44dd82a_***_Dirk van der Werf |
author |
Christopher Baker Michael Charlton April Cridland Stefan Eriksson Christopher Aled Isaac Jack Jones Niels Madsen Daniel Maxwell Patrick Mullan JOANNA PESZKA Dirk van der Werf |
author2 |
Christopher Baker W. Bertsche A. Capra C. L. Cesar Michael Charlton A. Christensen R. Collister April Cridland Stefan Eriksson A. Evans N. Evetts J. Fajans T. Friesen M. C. Fujiwara D. R. Gill P. Grandemange P. Granum J. S. Hangst M. E. Hayden D. Hodgkinson E. D. Hunter Christopher Aled Isaac M. A. Johnson Jack Jones S. A. Jones S. Jonsell A. Khramov L. Kurchaninov H. Landsberger Niels Madsen Daniel Maxwell J. T. K. McKenna S. Menary T. Momose Patrick Mullan J. J. Munich K. Olchanski A. Olin JOANNA PESZKA A. Powell P. Pusa C.Ø. Rasmussen F. Robicheaux R. L. Sacramento M. Sameed E. Sarid D. M. Silveira C. So G. Stutter T. D. Tharp R. I. Thompson C. Torkzaban Dirk van der Werf E. Ward J. S. Wurtele (ALPHA Collaboration) |
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Physical Review Research |
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Swansea University |
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10.1103/physrevresearch.6.l012008 |
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American Physical Society (APS) |
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description |
Antiprotons created by laser ionization of antihydrogen are observed to rapidly escape the ALPHA trap. Further, positron plasmas heat more quickly after the trap is illuminated by laser light for several hours. These phenomena can be caused by patch potentials—variations in the electrical potential along metal surfaces. A simple model of the effects of patch potentials explains the particle loss, and an experimental technique using trapped electrons is developed for measuring the electric field produced by the patch potentials. The model is validated by controlled experiments and simulations. |
published_date |
2024-01-16T08:27:45Z |
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1821393358249000960 |
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11.364387 |