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Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template

Y. Zhang, J. Bai, Yaonan Hou, R. M. Smith Orcid Logo, X. Yu Orcid Logo, Y. Gong, T. Wang

AIP Advances, Volume: 6, Issue: 2

Swansea University Author: Yaonan Hou

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DOI (Published version): 10.1063/1.4941444

Published in: AIP Advances
ISSN: 2158-3226
Published: AIP Publishing 2016
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URI: https://cronfa.swan.ac.uk/Record/cronfa65310
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spelling v2 65310 2023-12-14 Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template 113975f710084997abdb26ad5fa03e8e Yaonan Hou Yaonan Hou true false 2023-12-14 EEEG Journal Article AIP Advances 6 2 AIP Publishing 2158-3226 2 2 2016 2016-02-02 10.1063/1.4941444 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2024-04-10T15:24:17.4295041 2023-12-14T16:35:56.0137793 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Y. Zhang 1 J. Bai 2 Yaonan Hou 3 R. M. Smith 0000-0002-7718-7796 4 X. Yu 0000-0002-3797-9019 5 Y. Gong 6 T. Wang 7
title Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
spellingShingle Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
Yaonan Hou
title_short Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
title_full Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
title_fullStr Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
title_full_unstemmed Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
title_sort Defect reduction in overgrown semi-polar (11-22) GaN on a regularly arrayed micro-rod array template
author_id_str_mv 113975f710084997abdb26ad5fa03e8e
author_id_fullname_str_mv 113975f710084997abdb26ad5fa03e8e_***_Yaonan Hou
author Yaonan Hou
author2 Y. Zhang
J. Bai
Yaonan Hou
R. M. Smith
X. Yu
Y. Gong
T. Wang
format Journal article
container_title AIP Advances
container_volume 6
container_issue 2
publishDate 2016
institution Swansea University
issn 2158-3226
doi_str_mv 10.1063/1.4941444
publisher AIP Publishing
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2016-02-02T15:24:13Z
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score 11.013148

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