Journal article 665 views
Automatic recognition of epileptic EEG patterns via Extreme Learning Machine and multiresolution feature extraction
Expert Systems with Applications, Volume: 40, Issue: 14, Pages: 5477 - 5489
Swansea University Author: Jiaxiang Zhang
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DOI (Published version): 10.1016/j.eswa.2013.04.025
Abstract
Automatic recognition of epileptic EEG patterns via Extreme Learning Machine and multiresolution feature extraction
Published in: | Expert Systems with Applications |
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ISSN: | 0957-4174 |
Published: |
Elsevier BV
2013
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Online Access: |
Check full text
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URI: | https://cronfa.swan.ac.uk/Record/cronfa61339 |
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Keywords: |
Epilepsy diagnosis; Electroencephalogram (EEG); Multiresolution analysis; Feature extraction; Genetic algorithm (GA); Extreme Learning Machine (ELM) |
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College: |
Faculty of Science and Engineering |
Issue: |
14 |
Start Page: |
5477 |
End Page: |
5489 |