No Cover Image

Journal article 1147 views

Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures

Karol Kalna Orcid Logo

Microelectronics Reliability

Swansea University Author: Karol Kalna Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1016/j.microrel.2009.11.017

Published in: Microelectronics Reliability
Published: 2010
URI: https://cronfa.swan.ac.uk/Record/cronfa6065
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2013-07-23T11:56:06Z
last_indexed 2018-02-09T04:33:12Z
id cronfa6065
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2011-10-01T00:00:00.0000000</datestamp><bib-version>v2</bib-version><id>6065</id><entry>2013-09-03</entry><title>Impact of interface state trap density on the performance characteristics of different III&#x2013;V MOSFET architectures</title><swanseaauthors><author><sid>1329a42020e44fdd13de2f20d5143253</sid><ORCID>0000-0002-6333-9189</ORCID><firstname>Karol</firstname><surname>Kalna</surname><name>Karol Kalna</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2013-09-03</date><deptcode>EEEG</deptcode><abstract></abstract><type>Journal Article</type><journal>Microelectronics Reliability</journal><volume></volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2010</publishedYear><publishedDate>2010-12-31</publishedDate><doi>10.1016/j.microrel.2009.11.017</doi><url/><notes/><college>COLLEGE NANME</college><department>Electronic and Electrical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEEG</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2011-10-01T00:00:00.0000000</lastEdited><Created>2013-09-03T06:35:55.0000000</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering</level></path><authors><author><firstname>Karol</firstname><surname>Kalna</surname><orcid>0000-0002-6333-9189</orcid><order>1</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2011-10-01T00:00:00.0000000 v2 6065 2013-09-03 Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures 1329a42020e44fdd13de2f20d5143253 0000-0002-6333-9189 Karol Kalna Karol Kalna true false 2013-09-03 EEEG Journal Article Microelectronics Reliability 31 12 2010 2010-12-31 10.1016/j.microrel.2009.11.017 COLLEGE NANME Electronic and Electrical Engineering COLLEGE CODE EEEG Swansea University 2011-10-01T00:00:00.0000000 2013-09-03T06:35:55.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering Karol Kalna 0000-0002-6333-9189 1
title Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
spellingShingle Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
Karol Kalna
title_short Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
title_full Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
title_fullStr Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
title_full_unstemmed Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
title_sort Impact of interface state trap density on the performance characteristics of different III–V MOSFET architectures
author_id_str_mv 1329a42020e44fdd13de2f20d5143253
author_id_fullname_str_mv 1329a42020e44fdd13de2f20d5143253_***_Karol Kalna
author Karol Kalna
author2 Karol Kalna
format Journal article
container_title Microelectronics Reliability
publishDate 2010
institution Swansea University
doi_str_mv 10.1016/j.microrel.2009.11.017
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2010-12-31T03:07:27Z
_version_ 1763749760543490048
score 11.013148

Similar Items