Jennings, M., Li, F., Qiu, S., & Mawby, P. (2020). Reliability Study of MOS Capacitors Fabricated on 3C-SiC/Si Substrates. Materials Science Forum, 1004, pp. 659-664. doi:10.4028/www.scientific.net/msf.1004.659
Chicago Style CitationJennings, Mike, Fan Li, Song Qiu, and Phil Mawby. "Reliability Study of MOS Capacitors Fabricated On 3C-SiC/Si Substrates." Materials Science Forum 1004 (2020): 659-664.
MLA CitationJennings, Mike, Fan Li, Song Qiu, and Phil Mawby. "Reliability Study of MOS Capacitors Fabricated On 3C-SiC/Si Substrates." Materials Science Forum 1004 (2020): 659-664.
Warning: These citations may not always be 100% accurate.