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The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors

Robin Kerremans, Christina Kaiser, Wei Li, Nasim Zarrabi, Paul Meredith Orcid Logo, Ardalan Armin Orcid Logo

Advanced Optical Materials, Volume: 8, Issue: 16, Start page: 2000319

Swansea University Authors: Robin Kerremans, Wei Li, Nasim Zarrabi, Paul Meredith Orcid Logo, Ardalan Armin Orcid Logo

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DOI (Published version): 10.1002/adom.202000319

Abstract

Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electroma...

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Published in: Advanced Optical Materials
ISSN: 2195-1071 2195-1071
Published: Wiley 2020
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URI: https://cronfa.swan.ac.uk/Record/cronfa54426
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2022-08-09T16:08:56.6978580</datestamp><bib-version>v2</bib-version><id>54426</id><entry>2020-06-10</entry><title>The Optical Constants of Solution&#x2010;Processed Semiconductors&#x2014;New Challenges with Perovskites and Non&#x2010;Fullerene Acceptors</title><swanseaauthors><author><sid>ceb23b4837db851ac099a7d2762b341c</sid><firstname>Robin</firstname><surname>Kerremans</surname><name>Robin Kerremans</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>d6c46502d8e5f62c1af3c7fce334ac90</sid><firstname>Wei</firstname><surname>Li</surname><name>Wei Li</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>d20976a5892074dae0368a4bb4433f76</sid><firstname>Nasim</firstname><surname>Zarrabi</surname><name>Nasim Zarrabi</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>31e8fe57fa180d418afd48c3af280c2e</sid><ORCID>0000-0002-9049-7414</ORCID><firstname>Paul</firstname><surname>Meredith</surname><name>Paul Meredith</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>22b270622d739d81e131bec7a819e2fd</sid><ORCID>0000-0002-6129-5354</ORCID><firstname>Ardalan</firstname><surname>Armin</surname><name>Ardalan Armin</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2020-06-10</date><deptcode>SPH</deptcode><abstract>Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers&#x2013;Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV&#x2013;vis&#x2013;near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components.</abstract><type>Journal Article</type><journal>Advanced Optical Materials</journal><volume>8</volume><journalNumber>16</journalNumber><paginationStart>2000319</paginationStart><paginationEnd/><publisher>Wiley</publisher><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>2195-1071</issnPrint><issnElectronic>2195-1071</issnElectronic><keywords/><publishedDay>1</publishedDay><publishedMonth>8</publishedMonth><publishedYear>2020</publishedYear><publishedDate>2020-08-01</publishedDate><doi>10.1002/adom.202000319</doi><url>http://dx.doi.org/10.1002/adom.202000319</url><notes/><college>COLLEGE NANME</college><department>Physics</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SPH</DepartmentCode><institution>Swansea University</institution><apcterm>SU Library paid the OA fee (TA Institutional Deal)</apcterm><funders>This work was funded by the Welsh Government's S&#xEA;r Cymru II Program (Sustainable Advanced Materials) through the European Regional Development Fund and Welsh European Funding Office. R.K. and C.K. are the recipients of EPSRC DTP postgraduate awards. P.M. is a S&#xEA;r Cymru II Research Chair and A.A. a S&#xEA;r Cymru II Rising Star Fellow.</funders><projectreference/><lastEdited>2022-08-09T16:08:56.6978580</lastEdited><Created>2020-06-10T14:35:18.5424921</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Biosciences, Geography and Physics - Physics</level></path><authors><author><firstname>Robin</firstname><surname>Kerremans</surname><order>1</order></author><author><firstname>Christina</firstname><surname>Kaiser</surname><order>2</order></author><author><firstname>Wei</firstname><surname>Li</surname><order>3</order></author><author><firstname>Nasim</firstname><surname>Zarrabi</surname><order>4</order></author><author><firstname>Paul</firstname><surname>Meredith</surname><orcid>0000-0002-9049-7414</orcid><order>5</order></author><author><firstname>Ardalan</firstname><surname>Armin</surname><orcid>0000-0002-6129-5354</orcid><order>6</order></author></authors><documents><document><filename>54426__17456__2139dde944d74314b7621238940c408e.pdf</filename><originalFilename>Kerremans 2020.pdf</originalFilename><uploaded>2020-06-10T14:35:46.9405173</uploaded><type>Output</type><contentLength>3191366</contentLength><contentType>application/pdf</contentType><version>Version of Record</version><cronfaStatus>true</cronfaStatus><documentNotes>This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.</documentNotes><copyrightCorrect>true</copyrightCorrect></document></documents><OutputDurs/></rfc1807>
spelling 2022-08-09T16:08:56.6978580 v2 54426 2020-06-10 The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors ceb23b4837db851ac099a7d2762b341c Robin Kerremans Robin Kerremans true false d6c46502d8e5f62c1af3c7fce334ac90 Wei Li Wei Li true false d20976a5892074dae0368a4bb4433f76 Nasim Zarrabi Nasim Zarrabi true false 31e8fe57fa180d418afd48c3af280c2e 0000-0002-9049-7414 Paul Meredith Paul Meredith true false 22b270622d739d81e131bec7a819e2fd 0000-0002-6129-5354 Ardalan Armin Ardalan Armin true false 2020-06-10 SPH Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers–Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV–vis–near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components. Journal Article Advanced Optical Materials 8 16 2000319 Wiley 2195-1071 2195-1071 1 8 2020 2020-08-01 10.1002/adom.202000319 http://dx.doi.org/10.1002/adom.202000319 COLLEGE NANME Physics COLLEGE CODE SPH Swansea University SU Library paid the OA fee (TA Institutional Deal) This work was funded by the Welsh Government's Sêr Cymru II Program (Sustainable Advanced Materials) through the European Regional Development Fund and Welsh European Funding Office. R.K. and C.K. are the recipients of EPSRC DTP postgraduate awards. P.M. is a Sêr Cymru II Research Chair and A.A. a Sêr Cymru II Rising Star Fellow. 2022-08-09T16:08:56.6978580 2020-06-10T14:35:18.5424921 Faculty of Science and Engineering School of Biosciences, Geography and Physics - Physics Robin Kerremans 1 Christina Kaiser 2 Wei Li 3 Nasim Zarrabi 4 Paul Meredith 0000-0002-9049-7414 5 Ardalan Armin 0000-0002-6129-5354 6 54426__17456__2139dde944d74314b7621238940c408e.pdf Kerremans 2020.pdf 2020-06-10T14:35:46.9405173 Output 3191366 application/pdf Version of Record true This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited. true
title The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
spellingShingle The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
Robin Kerremans
Wei Li
Nasim Zarrabi
Paul Meredith
Ardalan Armin
title_short The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
title_full The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
title_fullStr The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
title_full_unstemmed The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
title_sort The Optical Constants of Solution‐Processed Semiconductors—New Challenges with Perovskites and Non‐Fullerene Acceptors
author_id_str_mv ceb23b4837db851ac099a7d2762b341c
d6c46502d8e5f62c1af3c7fce334ac90
d20976a5892074dae0368a4bb4433f76
31e8fe57fa180d418afd48c3af280c2e
22b270622d739d81e131bec7a819e2fd
author_id_fullname_str_mv ceb23b4837db851ac099a7d2762b341c_***_Robin Kerremans
d6c46502d8e5f62c1af3c7fce334ac90_***_Wei Li
d20976a5892074dae0368a4bb4433f76_***_Nasim Zarrabi
31e8fe57fa180d418afd48c3af280c2e_***_Paul Meredith
22b270622d739d81e131bec7a819e2fd_***_Ardalan Armin
author Robin Kerremans
Wei Li
Nasim Zarrabi
Paul Meredith
Ardalan Armin
author2 Robin Kerremans
Christina Kaiser
Wei Li
Nasim Zarrabi
Paul Meredith
Ardalan Armin
format Journal article
container_title Advanced Optical Materials
container_volume 8
container_issue 16
container_start_page 2000319
publishDate 2020
institution Swansea University
issn 2195-1071
2195-1071
doi_str_mv 10.1002/adom.202000319
publisher Wiley
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Biosciences, Geography and Physics - Physics{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Biosciences, Geography and Physics - Physics
url http://dx.doi.org/10.1002/adom.202000319
document_store_str 1
active_str 0
description Accurate determination of the optical constants of thin film solids has been an ongoing endeavor in optoelectronics and related fields for decades. These constants, namely the refractive index and extinction (or attenuation) coefficient, are the fundamental material properties that dictate electromagnetic field propagation in any medium. They form the inputs to well-established models that allow for design and optimization of multilayer stack structures such as thin film solar cells, light-emitting diodes, and photodetectors. These determinations are particularly challenging for materials that are scattering and highly absorbing. In this work, a new and resource-efficient approach for optical constant determination based upon transmission spectrophotometry in combination with an iterative, reverse transfer matrix model and the Kramers–Kronig relation is reported. The approach is validated using more conventional ellipsometry for a number of functionally important semiconductors, including the recently emergent organic non-fullerene electron acceptors (NFAs) and perovskites for which the optical constants in the UV–vis–near IR region are provided. Notably, the NFAs are found to present anomalously high refractive indices and extinction coefficients that are predicted to have a profound influence on the cavity electro-optics of the new record efficiency organic solar cells of which they are key components.
published_date 2020-08-01T04:07:57Z
_version_ 1763753567478349824
score 11.013148

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