No Cover Image

Journal article 1270 views

Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration

David Gethin Orcid Logo, Tim Claypole Orcid Logo, Eifion Jewell Orcid Logo, Christopher Phillips Orcid Logo

Measurement Science and Technology

Swansea University Authors: David Gethin Orcid Logo, Tim Claypole Orcid Logo, Eifion Jewell Orcid Logo, Christopher Phillips Orcid Logo

Full text not available from this repository: check for access using links below.

DOI (Published version): 10.1088/0957-0233/19/2/025703

Published in: Measurement Science and Technology
Published: 2008
URI: https://cronfa.swan.ac.uk/Record/cronfa5350
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2013-07-23T11:52:19Z
last_indexed 2018-02-09T04:31:34Z
id cronfa5350
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2011-10-01T00:00:00.0000000</datestamp><bib-version>v2</bib-version><id>5350</id><entry>2013-09-03</entry><title>Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration</title><swanseaauthors><author><sid>20b93675a5457203ae87ebc32bd6d155</sid><ORCID>0000-0002-7142-8253</ORCID><firstname>David</firstname><surname>Gethin</surname><name>David Gethin</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>7735385522f1e68a8775b4f709e91d55</sid><ORCID>0000-0003-1393-9634</ORCID><firstname>Tim</firstname><surname>Claypole</surname><name>Tim Claypole</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>13dc152c178d51abfe0634445b0acf07</sid><ORCID>0000-0002-6894-2251</ORCID><firstname>Eifion</firstname><surname>Jewell</surname><name>Eifion Jewell</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>cc734f776f10b3fb9b43816c9f617bb5</sid><ORCID>0000-0001-8011-710X</ORCID><firstname>Christopher</firstname><surname>Phillips</surname><name>Christopher Phillips</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2013-09-03</date><deptcode>MECH</deptcode><abstract/><type>Journal Article</type><journal>Measurement Science and Technology</journal><volume></volume><journalNumber></journalNumber><paginationStart/><paginationEnd/><publisher/><placeOfPublication/><issnPrint/><issnElectronic/><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2008</publishedYear><publishedDate>2008-12-31</publishedDate><doi>10.1088/0957-0233/19/2/025703</doi><url/><notes/><college>COLLEGE NANME</college><department>Mechanical Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>MECH</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2011-10-01T00:00:00.0000000</lastEdited><Created>2013-09-03T06:01:08.0000000</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering</level></path><authors><author><firstname>David</firstname><surname>Gethin</surname><orcid>0000-0002-7142-8253</orcid><order>1</order></author><author><firstname>Tim</firstname><surname>Claypole</surname><orcid>0000-0003-1393-9634</orcid><order>2</order></author><author><firstname>Eifion</firstname><surname>Jewell</surname><orcid>0000-0002-6894-2251</orcid><order>3</order></author><author><firstname>Christopher</firstname><surname>Phillips</surname><orcid>0000-0001-8011-710X</orcid><order>4</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2011-10-01T00:00:00.0000000 v2 5350 2013-09-03 Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration 20b93675a5457203ae87ebc32bd6d155 0000-0002-7142-8253 David Gethin David Gethin true false 7735385522f1e68a8775b4f709e91d55 0000-0003-1393-9634 Tim Claypole Tim Claypole true false 13dc152c178d51abfe0634445b0acf07 0000-0002-6894-2251 Eifion Jewell Eifion Jewell true false cc734f776f10b3fb9b43816c9f617bb5 0000-0001-8011-710X Christopher Phillips Christopher Phillips true false 2013-09-03 MECH Journal Article Measurement Science and Technology 31 12 2008 2008-12-31 10.1088/0957-0233/19/2/025703 COLLEGE NANME Mechanical Engineering COLLEGE CODE MECH Swansea University 2011-10-01T00:00:00.0000000 2013-09-03T06:01:08.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering David Gethin 0000-0002-7142-8253 1 Tim Claypole 0000-0003-1393-9634 2 Eifion Jewell 0000-0002-6894-2251 3 Christopher Phillips 0000-0001-8011-710X 4
title Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
spellingShingle Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
title_short Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_full Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_fullStr Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_full_unstemmed Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
title_sort Development of measurement techniques to characterize the optical properties of transparent films with application in in-mould decoration
author_id_str_mv 20b93675a5457203ae87ebc32bd6d155
7735385522f1e68a8775b4f709e91d55
13dc152c178d51abfe0634445b0acf07
cc734f776f10b3fb9b43816c9f617bb5
author_id_fullname_str_mv 20b93675a5457203ae87ebc32bd6d155_***_David Gethin
7735385522f1e68a8775b4f709e91d55_***_Tim Claypole
13dc152c178d51abfe0634445b0acf07_***_Eifion Jewell
cc734f776f10b3fb9b43816c9f617bb5_***_Christopher Phillips
author David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
author2 David Gethin
Tim Claypole
Eifion Jewell
Christopher Phillips
format Journal article
container_title Measurement Science and Technology
publishDate 2008
institution Swansea University
doi_str_mv 10.1088/0957-0233/19/2/025703
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
document_store_str 0
active_str 0
published_date 2008-12-31T03:06:25Z
_version_ 1763749695836913664
score 11.037144