Kalna, K., Alqaysi, M. H., Martinez, A., Ahmeda, K., Ubochi, B., & Muniz, A. M. (2019). Impact of interface traps/defects and self-heating on the degradation of performance of a 4H-SiC VDMOSFET. IET Power Electronics, 12(11), pp. 2731-2740. doi:10.1049/iet-pel.2018.5897

Kalna, Karol, Mustafa H. Alqaysi, Antonio Martinez, Khaled Ahmeda, Brendan Ubochi, and Antonio Martinez Muniz. "Impact of Interface Traps/defects and Self-heating On the Degradation of Performance of a 4H-SiC VDMOSFET." IET Power Electronics 12, no. 11 (2019): 2731-2740.

Kalna, Karol, et al. "Impact of Interface Traps/defects and Self-heating On the Degradation of Performance of a 4H-SiC VDMOSFET." IET Power Electronics 12.11 (2019): 2731-2740.