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Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter

Chris J. Barnett, Christopher Evans, James E. McCormack, Cathren E. Gowenlock, Peter Dunstan, Wade Adams, Alvin Orbaek White Orcid Logo, Andrew Barron

Nano Letters, Volume: 19, Issue: 8, Pages: 4861 - 4865

Swansea University Authors: Alvin Orbaek White Orcid Logo, Andrew Barron

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DOI (Published version): 10.1021/acs.nanolett.9b00025

Abstract

Measurement of the angular and overlap dependence of the conduction between two identical carbon nanotubes (CNTs), with the same diameter and chirality, has only been possible through theoretical calculations; however, our observation of increased resistance adjacent to the junction between two CNTs...

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Published in: Nano Letters
ISSN: 1530-6984 1530-6992
Published: 2019
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URI: https://cronfa.swan.ac.uk/Record/cronfa51710
first_indexed 2019-09-06T15:26:51Z
last_indexed 2019-10-15T20:22:41Z
id cronfa51710
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spelling 2019-10-15T15:43:30.2532282 v2 51710 2019-09-06 Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter 8414a23650d4403fdfe1a735dbd2e24e 0000-0001-6338-5970 Alvin Orbaek White Alvin Orbaek White true false 92e452f20936d688d36f91c78574241d Andrew Barron Andrew Barron true false 2019-09-06 EAAS Measurement of the angular and overlap dependence of the conduction between two identical carbon nanotubes (CNTs), with the same diameter and chirality, has only been possible through theoretical calculations; however, our observation of increased resistance adjacent to the junction between two CNTs facilitates such measurements. Since electrical resistance was found to increase with increased diameter ratio, applying 10 V to one of dissimilar diameter CNTs results in cleavage at the junction. Manipulation of the resulting identical CNTs (created by cutting a single CNT) allows for the direct measurement of the angular and parallel overlap conduction. Angular (13° < θ < 63°) dependence shows two minima (22° and 44°) and a maximum at 30°, and conduction between parallel CNTs increases with overall tip separation but shows a sinusoidal relationship with contact length, consistent with the concept of atomic scale registry. Journal Article Nano Letters 19 8 4861 4865 1530-6984 1530-6992 Multiwalled carbon nanotubes, manipulation, resistance, conduction 14 8 2019 2019-08-14 10.1021/acs.nanolett.9b00025 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University 2019-10-15T15:43:30.2532282 2019-09-06T10:05:04.2179639 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemical Engineering Chris J. Barnett 1 Christopher Evans 2 James E. McCormack 3 Cathren E. Gowenlock 4 Peter Dunstan 5 Wade Adams 6 Alvin Orbaek White 0000-0001-6338-5970 7 Andrew Barron 8 0051710-15102019154316.pdf barnett2019(2)v2.pdf 2019-10-15T15:43:16.9100000 Output 886595 application/pdf Accepted Manuscript true 2020-07-02T00:00:00.0000000 true eng
title Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
spellingShingle Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
Alvin Orbaek White
Andrew Barron
title_short Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
title_full Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
title_fullStr Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
title_full_unstemmed Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
title_sort Experimental Measurement of Angular and Overlap Dependence of Conduction between Carbon Nanotubes of Identical Chirality and Diameter
author_id_str_mv 8414a23650d4403fdfe1a735dbd2e24e
92e452f20936d688d36f91c78574241d
author_id_fullname_str_mv 8414a23650d4403fdfe1a735dbd2e24e_***_Alvin Orbaek White
92e452f20936d688d36f91c78574241d_***_Andrew Barron
author Alvin Orbaek White
Andrew Barron
author2 Chris J. Barnett
Christopher Evans
James E. McCormack
Cathren E. Gowenlock
Peter Dunstan
Wade Adams
Alvin Orbaek White
Andrew Barron
format Journal article
container_title Nano Letters
container_volume 19
container_issue 8
container_start_page 4861
publishDate 2019
institution Swansea University
issn 1530-6984
1530-6992
doi_str_mv 10.1021/acs.nanolett.9b00025
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Chemical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemical Engineering
document_store_str 1
active_str 0
description Measurement of the angular and overlap dependence of the conduction between two identical carbon nanotubes (CNTs), with the same diameter and chirality, has only been possible through theoretical calculations; however, our observation of increased resistance adjacent to the junction between two CNTs facilitates such measurements. Since electrical resistance was found to increase with increased diameter ratio, applying 10 V to one of dissimilar diameter CNTs results in cleavage at the junction. Manipulation of the resulting identical CNTs (created by cutting a single CNT) allows for the direct measurement of the angular and parallel overlap conduction. Angular (13° < θ < 63°) dependence shows two minima (22° and 44°) and a maximum at 30°, and conduction between parallel CNTs increases with overall tip separation but shows a sinusoidal relationship with contact length, consistent with the concept of atomic scale registry.
published_date 2019-08-14T19:47:23Z
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score 11.04748

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