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Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces

B. J. Eves, F. Festy, K. Svensson, R. E. Palmer, Richard Palmer Orcid Logo

Applied Physics Letters, Volume: 77, Issue: 25, Pages: 4223 - 4225

Swansea University Author: Richard Palmer Orcid Logo

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DOI (Published version): 10.1063/1.1333404

Published in: Applied Physics Letters
ISSN: 0003-6951 1077-3118
Published: 2000
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URI: https://cronfa.swan.ac.uk/Record/cronfa49458
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first_indexed 2019-03-18T20:01:58Z
last_indexed 2019-03-18T20:01:58Z
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spelling 2019-03-18T14:36:51.6584504 v2 49458 2019-03-18 Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces 6ae369618efc7424d9774377536ea519 0000-0001-8728-8083 Richard Palmer Richard Palmer true false 2019-03-18 MECH Journal Article Applied Physics Letters 77 25 4223 4225 0003-6951 1077-3118 31 12 2000 2000-12-31 10.1063/1.1333404 COLLEGE NANME Mechanical Engineering COLLEGE CODE MECH Swansea University 2019-03-18T14:36:51.6584504 2019-03-18T14:36:51.4437380 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering B. J. Eves 1 F. Festy 2 K. Svensson 3 R. E. Palmer 4 Richard Palmer 0000-0001-8728-8083 5
title Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
spellingShingle Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
Richard Palmer
title_short Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
title_full Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
title_fullStr Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
title_full_unstemmed Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
title_sort Scanning probe energy loss spectroscopy: Angular resolved measurements on silicon and graphite surfaces
author_id_str_mv 6ae369618efc7424d9774377536ea519
author_id_fullname_str_mv 6ae369618efc7424d9774377536ea519_***_Richard Palmer
author Richard Palmer
author2 B. J. Eves
F. Festy
K. Svensson
R. E. Palmer
Richard Palmer
format Journal article
container_title Applied Physics Letters
container_volume 77
container_issue 25
container_start_page 4223
publishDate 2000
institution Swansea University
issn 0003-6951
1077-3118
doi_str_mv 10.1063/1.1333404
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
document_store_str 0
active_str 0
published_date 2000-12-31T04:00:29Z
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score 11.037056

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