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A proximal retarding field analyzer for scanning probe energy loss spectroscopy

Karl Bauer, Shane Murphy, Richard Palmer Orcid Logo

Nanotechnology, Volume: 28, Issue: 10, Start page: 105711

Swansea University Author: Richard Palmer Orcid Logo

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DOI (Published version): 10.1088/1361-6528/aa5938

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NanotechnologyPAPER • THE FOLLOWING ARTICLE IS OPEN ACCESSA proximal retarding field analyzer for scanning probe energy loss spectroscopyKarl Bauer, Shane Murphy and Richard E PalmerPublished 8 February 2017 • © 2017 IOP Publishing LtdNanotechnology, Volume 28, Number 10Download Article PDFFiguresRe...

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Published in: Nanotechnology
ISSN: 0957-4484 1361-6528
Published: 2017
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URI: https://cronfa.swan.ac.uk/Record/cronfa49223
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2019-07-18T14:54:03.6158789</datestamp><bib-version>v2</bib-version><id>49223</id><entry>2019-03-18</entry><title>A proximal retarding field analyzer for scanning probe energy loss spectroscopy</title><swanseaauthors><author><sid>6ae369618efc7424d9774377536ea519</sid><ORCID>0000-0001-8728-8083</ORCID><firstname>Richard</firstname><surname>Palmer</surname><name>Richard Palmer</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2019-03-18</date><deptcode>MECH</deptcode><abstract>NanotechnologyPAPER &#x2022; THE FOLLOWING ARTICLE IS OPEN ACCESSA proximal retarding field analyzer for scanning probe energy loss spectroscopyKarl Bauer, Shane Murphy and Richard E PalmerPublished 8 February 2017 &#x2022; &#xA9; 2017 IOP Publishing LtdNanotechnology, Volume 28, Number 10Download Article PDFFiguresReferencesDownload PDF1206 Total downloads 11 citation on Dimensions.Article has an altmetric score of 1Turn on MathJaxShare this articleShare this content via emailShare on FacebookShare on TwitterShare on Google+Share on CiteULikeShare on MendeleyHide article informationAuthor e-mailsr.e.palmer@bham.ac.ukAuthor affiliationsNanoscale Physics, Chemistry and Engineering Research Laboratory, School of Physics and Astronomy, University of Birmingham, Edgbaston, Birmingham, B15 2TT, United KingdomORCID iDsKarl Bauer https://orcid.org/0000-0003-0664-2082DatesReceived 10 October 2016Accepted 13 January 2017Accepted Manuscript online 13 January 2017Published 8 February 2017 Check for updates using CrossmarkPeer review informationMethod: Single-blindRevisions: 1Screened for originality? YesCitationKarl Bauer et al 2017 Nanotechnology 28 105711Create citation alertDOIhttps://doi.org/10.1088/1361-6528/aa5938Buy this article in print Journal RSS feed Sign up for new issue notificationsAbstractA compact proximal retarding field analyzer for scanning probe energy loss spectroscopy measurements is described. Using the scanning tunneling microscope (STM) tip as a field emission (FE) electron source in conjunction with this analyzer, which is placed at a glancing angle to the surface plane, FE sample current and electron reflectivity imaging may be performed simultaneously. This is demonstrated in measurements of Ag nanostructures prepared on graphite by electron-beam lithography, where a material contrast of 13% is observed, with a lateral resolution of 25 nm, between the silver and graphite in electron reflectivity images. Topological contrast mechanisms such as edge enhancement and shadowing are also observed, giving rise to additional features in the electron reflectivity images. The same instrument configuration has been used to measure electron energy loss spectra on bare graphite, where the zero loss peak, &#x3C0; band plasmon loss peak and secondary electron peaks are observed. 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spelling 2019-07-18T14:54:03.6158789 v2 49223 2019-03-18 A proximal retarding field analyzer for scanning probe energy loss spectroscopy 6ae369618efc7424d9774377536ea519 0000-0001-8728-8083 Richard Palmer Richard Palmer true false 2019-03-18 MECH NanotechnologyPAPER • THE FOLLOWING ARTICLE IS OPEN ACCESSA proximal retarding field analyzer for scanning probe energy loss spectroscopyKarl Bauer, Shane Murphy and Richard E PalmerPublished 8 February 2017 • © 2017 IOP Publishing LtdNanotechnology, Volume 28, Number 10Download Article PDFFiguresReferencesDownload PDF1206 Total downloads 11 citation on Dimensions.Article has an altmetric score of 1Turn on MathJaxShare this articleShare this content via emailShare on FacebookShare on TwitterShare on Google+Share on CiteULikeShare on MendeleyHide article informationAuthor e-mailsr.e.palmer@bham.ac.ukAuthor affiliationsNanoscale Physics, Chemistry and Engineering Research Laboratory, School of Physics and Astronomy, University of Birmingham, Edgbaston, Birmingham, B15 2TT, United KingdomORCID iDsKarl Bauer https://orcid.org/0000-0003-0664-2082DatesReceived 10 October 2016Accepted 13 January 2017Accepted Manuscript online 13 January 2017Published 8 February 2017 Check for updates using CrossmarkPeer review informationMethod: Single-blindRevisions: 1Screened for originality? YesCitationKarl Bauer et al 2017 Nanotechnology 28 105711Create citation alertDOIhttps://doi.org/10.1088/1361-6528/aa5938Buy this article in print Journal RSS feed Sign up for new issue notificationsAbstractA compact proximal retarding field analyzer for scanning probe energy loss spectroscopy measurements is described. Using the scanning tunneling microscope (STM) tip as a field emission (FE) electron source in conjunction with this analyzer, which is placed at a glancing angle to the surface plane, FE sample current and electron reflectivity imaging may be performed simultaneously. This is demonstrated in measurements of Ag nanostructures prepared on graphite by electron-beam lithography, where a material contrast of 13% is observed, with a lateral resolution of 25 nm, between the silver and graphite in electron reflectivity images. Topological contrast mechanisms such as edge enhancement and shadowing are also observed, giving rise to additional features in the electron reflectivity images. The same instrument configuration has been used to measure electron energy loss spectra on bare graphite, where the zero loss peak, π band plasmon loss peak and secondary electron peaks are observed. Using this simple and compact analyzer an STM, with sufficient open access to the tip-sample junction, may easily be augmented to provide simultaneous elemental and topographic mapping, supplementing STM image measurements with FE sample current and electron reflectivity images, as well as electron energy loss spectroscopy measurements, in the same instrument. Journal Article Nanotechnology 28 10 105711 0957-4484 1361-6528 8 2 2017 2017-02-08 10.1088/1361-6528/aa5938 COLLEGE NANME Mechanical Engineering COLLEGE CODE MECH Swansea University 2019-07-18T14:54:03.6158789 2019-03-18T14:27:51.1613326 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering Karl Bauer 1 Shane Murphy 2 Richard Palmer 0000-0001-8728-8083 3 0049223-13052019112713.pdf bauer2017.pdf 2019-05-13T11:27:13.5770000 Output 3823618 application/pdf Version of Record true 2019-05-13T00:00:00.0000000 Distributed under the terms of a Creative Commons Attribution Non-Commercial (CC-BY-3.0) true eng
title A proximal retarding field analyzer for scanning probe energy loss spectroscopy
spellingShingle A proximal retarding field analyzer for scanning probe energy loss spectroscopy
Richard Palmer
title_short A proximal retarding field analyzer for scanning probe energy loss spectroscopy
title_full A proximal retarding field analyzer for scanning probe energy loss spectroscopy
title_fullStr A proximal retarding field analyzer for scanning probe energy loss spectroscopy
title_full_unstemmed A proximal retarding field analyzer for scanning probe energy loss spectroscopy
title_sort A proximal retarding field analyzer for scanning probe energy loss spectroscopy
author_id_str_mv 6ae369618efc7424d9774377536ea519
author_id_fullname_str_mv 6ae369618efc7424d9774377536ea519_***_Richard Palmer
author Richard Palmer
author2 Karl Bauer
Shane Murphy
Richard Palmer
format Journal article
container_title Nanotechnology
container_volume 28
container_issue 10
container_start_page 105711
publishDate 2017
institution Swansea University
issn 0957-4484
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doi_str_mv 10.1088/1361-6528/aa5938
college_str Faculty of Science and Engineering
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hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Mechanical Engineering
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description NanotechnologyPAPER • THE FOLLOWING ARTICLE IS OPEN ACCESSA proximal retarding field analyzer for scanning probe energy loss spectroscopyKarl Bauer, Shane Murphy and Richard E PalmerPublished 8 February 2017 • © 2017 IOP Publishing LtdNanotechnology, Volume 28, Number 10Download Article PDFFiguresReferencesDownload PDF1206 Total downloads 11 citation on Dimensions.Article has an altmetric score of 1Turn on MathJaxShare this articleShare this content via emailShare on FacebookShare on TwitterShare on Google+Share on CiteULikeShare on MendeleyHide article informationAuthor e-mailsr.e.palmer@bham.ac.ukAuthor affiliationsNanoscale Physics, Chemistry and Engineering Research Laboratory, School of Physics and Astronomy, University of Birmingham, Edgbaston, Birmingham, B15 2TT, United KingdomORCID iDsKarl Bauer https://orcid.org/0000-0003-0664-2082DatesReceived 10 October 2016Accepted 13 January 2017Accepted Manuscript online 13 January 2017Published 8 February 2017 Check for updates using CrossmarkPeer review informationMethod: Single-blindRevisions: 1Screened for originality? YesCitationKarl Bauer et al 2017 Nanotechnology 28 105711Create citation alertDOIhttps://doi.org/10.1088/1361-6528/aa5938Buy this article in print Journal RSS feed Sign up for new issue notificationsAbstractA compact proximal retarding field analyzer for scanning probe energy loss spectroscopy measurements is described. Using the scanning tunneling microscope (STM) tip as a field emission (FE) electron source in conjunction with this analyzer, which is placed at a glancing angle to the surface plane, FE sample current and electron reflectivity imaging may be performed simultaneously. This is demonstrated in measurements of Ag nanostructures prepared on graphite by electron-beam lithography, where a material contrast of 13% is observed, with a lateral resolution of 25 nm, between the silver and graphite in electron reflectivity images. Topological contrast mechanisms such as edge enhancement and shadowing are also observed, giving rise to additional features in the electron reflectivity images. The same instrument configuration has been used to measure electron energy loss spectra on bare graphite, where the zero loss peak, π band plasmon loss peak and secondary electron peaks are observed. Using this simple and compact analyzer an STM, with sufficient open access to the tip-sample junction, may easily be augmented to provide simultaneous elemental and topographic mapping, supplementing STM image measurements with FE sample current and electron reflectivity images, as well as electron energy loss spectroscopy measurements, in the same instrument.
published_date 2017-02-08T04:00:02Z
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score 11.013731

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