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An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)

Hamed Safaie, Ria L. Mitchell, Richard Johnston Orcid Logo, James Russell, Cameron Pleydell-Pearce

Microscopy and Microanalysis, Volume: 24, Issue: S1, Pages: 400 - 401

Swansea University Author: Richard Johnston Orcid Logo

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Published in: Microscopy and Microanalysis
ISSN: 1431-9276 1435-8115
Published: 2018
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URI: https://cronfa.swan.ac.uk/Record/cronfa43489
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first_indexed 2018-08-15T18:55:52Z
last_indexed 2018-10-08T19:26:09Z
id cronfa43489
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spelling 2018-10-08T14:33:46.8788884 v2 43489 2018-08-15 An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM) 23282e7acce87dd926b8a62ae410a393 0000-0003-1977-6418 Richard Johnston Richard Johnston true false 2018-08-15 MTLS Journal Article Microscopy and Microanalysis 24 S1 400 401 1431-9276 1435-8115 31 12 2018 2018-12-31 10.1017/S1431927618002490 COLLEGE NANME Materials Science and Engineering COLLEGE CODE MTLS Swansea University 2018-10-08T14:33:46.8788884 2018-08-15T15:03:35.8975275 Faculty of Science and Engineering School of Engineering and Applied Sciences - Materials Science and Engineering Hamed Safaie 1 Ria L. Mitchell 2 Richard Johnston 0000-0003-1977-6418 3 James Russell 4 Cameron Pleydell-Pearce 5
title An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
spellingShingle An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
Richard Johnston
title_short An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
title_full An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
title_fullStr An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
title_full_unstemmed An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
title_sort An Assessment of Polarized Light Microscopy for the Quantification of Grain Size and Orientation in Titanium Alloys via Microanalytical Correlative Light to Electron Microscopy (CLEM)
author_id_str_mv 23282e7acce87dd926b8a62ae410a393
author_id_fullname_str_mv 23282e7acce87dd926b8a62ae410a393_***_Richard Johnston
author Richard Johnston
author2 Hamed Safaie
Ria L. Mitchell
Richard Johnston
James Russell
Cameron Pleydell-Pearce
format Journal article
container_title Microscopy and Microanalysis
container_volume 24
container_issue S1
container_start_page 400
publishDate 2018
institution Swansea University
issn 1431-9276
1435-8115
doi_str_mv 10.1017/S1431927618002490
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Materials Science and Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Materials Science and Engineering
document_store_str 0
active_str 0
published_date 2018-12-31T03:54:42Z
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