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Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes

Chris J. Barnett, Cathren Gowenlock Orcid Logo, Kathryn Welsby, Alvin Orbaek White Orcid Logo, Andrew Barron Orcid Logo

Nano Letters, Volume: 18, Issue: 2, Pages: 695 - 700

Swansea University Authors: Cathren Gowenlock Orcid Logo, Alvin Orbaek White Orcid Logo, Andrew Barron Orcid Logo

Abstract

Two-point probe and Raman spectroscopy have been used to investigate the effects of vacuum annealing and argon bombardment, on the conduction characteristics of MWCNTs. Surface contamination has a large effect on the two-point probe conductivity measurements resulting in inconsistent and non-reprodu...

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Published in: Nano Letters
ISSN: 1530-6984 1530-6992
Published: 2018
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URI: https://cronfa.swan.ac.uk/Record/cronfa37946
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fullrecord <?xml version="1.0"?><rfc1807><datestamp>2021-01-13T13:14:55.6514285</datestamp><bib-version>v2</bib-version><id>37946</id><entry>2018-01-05</entry><title>Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes</title><swanseaauthors><author><sid>3e999073c98799427c833bb5d331ef51</sid><ORCID>0000-0001-5774-5263</ORCID><firstname>Cathren</firstname><surname>Gowenlock</surname><name>Cathren Gowenlock</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>8414a23650d4403fdfe1a735dbd2e24e</sid><ORCID>0000-0001-6338-5970</ORCID><firstname>Alvin</firstname><surname>Orbaek White</surname><name>Alvin Orbaek White</name><active>true</active><ethesisStudent>false</ethesisStudent></author><author><sid>92e452f20936d688d36f91c78574241d</sid><ORCID>0000-0002-2018-8288</ORCID><firstname>Andrew</firstname><surname>Barron</surname><name>Andrew Barron</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2018-01-05</date><deptcode>EEN</deptcode><abstract>Two-point probe and Raman spectroscopy have been used to investigate the effects of vacuum annealing and argon bombardment, on the conduction characteristics of MWCNTs. Surface contamination has a large effect on the two-point probe conductivity measurements resulting in inconsistent and non-reproducible contacts as well as enhancing the electric field under the contacts resulting from overlapping depletion regions when probe separations are small (&amp;#60; 4 &#x3BC;m) causing very high resistances. Annealing at 200 &#xB0;C and 500 &#xB0;C reduced the surface contamination on the MWCNT, but high resistance contacts still did not allow intrinsic conductivity measurements of the MWCNT. The high resistance measured due to the overlapping depletion regions was not observed after annealing to 500 &#xB0;C. Argon bombardment reduced the surface contamination more than vacuum annealing at 500 &#xB0;C but caused a slight increase in the defects concentration, enabling the resistivity of the MWCNT to be calculated, which is found to be dependent on the CNT diameter. The observations have significant implications for future CNT-based devices.</abstract><type>Journal Article</type><journal>Nano Letters</journal><volume>18</volume><journalNumber>2</journalNumber><paginationStart>695</paginationStart><paginationEnd>700</paginationEnd><publisher/><placeOfPublication/><isbnPrint/><isbnElectronic/><issnPrint>1530-6984</issnPrint><issnElectronic>1530-6992</issnElectronic><keywords/><publishedDay>14</publishedDay><publishedMonth>2</publishedMonth><publishedYear>2018</publishedYear><publishedDate>2018-02-14</publishedDate><doi>10.1021/acs.nanolett.7b03390</doi><url/><notes/><college>COLLEGE NANME</college><department>Engineering</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>EEN</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2021-01-13T13:14:55.6514285</lastEdited><Created>2018-01-05T11:01:26.1808034</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Engineering and Applied Sciences - Uncategorised</level></path><authors><author><firstname>Chris J.</firstname><surname>Barnett</surname><order>1</order></author><author><firstname>Cathren</firstname><surname>Gowenlock</surname><orcid>0000-0001-5774-5263</orcid><order>2</order></author><author><firstname>Kathryn</firstname><surname>Welsby</surname><order>3</order></author><author><firstname>Alvin</firstname><surname>Orbaek White</surname><orcid>0000-0001-6338-5970</orcid><order>4</order></author><author><firstname>Andrew</firstname><surname>Barron</surname><orcid>0000-0002-2018-8288</orcid><order>5</order></author></authors><documents><document><filename>0037946-05012018110431.pdf</filename><originalFilename>barnett2017v3.pdf</originalFilename><uploaded>2018-01-05T11:04:31.7630000</uploaded><type>Output</type><contentLength>1061459</contentLength><contentType>application/pdf</contentType><version>Accepted Manuscript</version><cronfaStatus>true</cronfaStatus><embargoDate>2018-12-19T00:00:00.0000000</embargoDate><copyrightCorrect>true</copyrightCorrect><language>eng</language></document></documents><OutputDurs/></rfc1807>
spelling 2021-01-13T13:14:55.6514285 v2 37946 2018-01-05 Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes 3e999073c98799427c833bb5d331ef51 0000-0001-5774-5263 Cathren Gowenlock Cathren Gowenlock true false 8414a23650d4403fdfe1a735dbd2e24e 0000-0001-6338-5970 Alvin Orbaek White Alvin Orbaek White true false 92e452f20936d688d36f91c78574241d 0000-0002-2018-8288 Andrew Barron Andrew Barron true false 2018-01-05 EEN Two-point probe and Raman spectroscopy have been used to investigate the effects of vacuum annealing and argon bombardment, on the conduction characteristics of MWCNTs. Surface contamination has a large effect on the two-point probe conductivity measurements resulting in inconsistent and non-reproducible contacts as well as enhancing the electric field under the contacts resulting from overlapping depletion regions when probe separations are small (&#60; 4 μm) causing very high resistances. Annealing at 200 °C and 500 °C reduced the surface contamination on the MWCNT, but high resistance contacts still did not allow intrinsic conductivity measurements of the MWCNT. The high resistance measured due to the overlapping depletion regions was not observed after annealing to 500 °C. Argon bombardment reduced the surface contamination more than vacuum annealing at 500 °C but caused a slight increase in the defects concentration, enabling the resistivity of the MWCNT to be calculated, which is found to be dependent on the CNT diameter. The observations have significant implications for future CNT-based devices. Journal Article Nano Letters 18 2 695 700 1530-6984 1530-6992 14 2 2018 2018-02-14 10.1021/acs.nanolett.7b03390 COLLEGE NANME Engineering COLLEGE CODE EEN Swansea University 2021-01-13T13:14:55.6514285 2018-01-05T11:01:26.1808034 Faculty of Science and Engineering School of Engineering and Applied Sciences - Uncategorised Chris J. Barnett 1 Cathren Gowenlock 0000-0001-5774-5263 2 Kathryn Welsby 3 Alvin Orbaek White 0000-0001-6338-5970 4 Andrew Barron 0000-0002-2018-8288 5 0037946-05012018110431.pdf barnett2017v3.pdf 2018-01-05T11:04:31.7630000 Output 1061459 application/pdf Accepted Manuscript true 2018-12-19T00:00:00.0000000 true eng
title Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
spellingShingle Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
Cathren Gowenlock
Alvin Orbaek White
Andrew Barron
title_short Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
title_full Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
title_fullStr Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
title_full_unstemmed Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
title_sort Spatial and Contamination-Dependent Electrical Properties of Carbon Nanotubes
author_id_str_mv 3e999073c98799427c833bb5d331ef51
8414a23650d4403fdfe1a735dbd2e24e
92e452f20936d688d36f91c78574241d
author_id_fullname_str_mv 3e999073c98799427c833bb5d331ef51_***_Cathren Gowenlock
8414a23650d4403fdfe1a735dbd2e24e_***_Alvin Orbaek White
92e452f20936d688d36f91c78574241d_***_Andrew Barron
author Cathren Gowenlock
Alvin Orbaek White
Andrew Barron
author2 Chris J. Barnett
Cathren Gowenlock
Kathryn Welsby
Alvin Orbaek White
Andrew Barron
format Journal article
container_title Nano Letters
container_volume 18
container_issue 2
container_start_page 695
publishDate 2018
institution Swansea University
issn 1530-6984
1530-6992
doi_str_mv 10.1021/acs.nanolett.7b03390
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Uncategorised{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Uncategorised
document_store_str 1
active_str 0
description Two-point probe and Raman spectroscopy have been used to investigate the effects of vacuum annealing and argon bombardment, on the conduction characteristics of MWCNTs. Surface contamination has a large effect on the two-point probe conductivity measurements resulting in inconsistent and non-reproducible contacts as well as enhancing the electric field under the contacts resulting from overlapping depletion regions when probe separations are small (&#60; 4 μm) causing very high resistances. Annealing at 200 °C and 500 °C reduced the surface contamination on the MWCNT, but high resistance contacts still did not allow intrinsic conductivity measurements of the MWCNT. The high resistance measured due to the overlapping depletion regions was not observed after annealing to 500 °C. Argon bombardment reduced the surface contamination more than vacuum annealing at 500 °C but caused a slight increase in the defects concentration, enabling the resistivity of the MWCNT to be calculated, which is found to be dependent on the CNT diameter. The observations have significant implications for future CNT-based devices.
published_date 2018-02-14T03:47:54Z
_version_ 1763752305817026560
score 11.037056