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Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts

Naresh Kumar, Alasdair Rae, Deb Roy Orcid Logo

Applied Physics Letters, Volume: 104, Issue: 12, Start page: 123106

Swansea University Author: Deb Roy Orcid Logo

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DOI (Published version): 10.1063/1.4869184

Published in: Applied Physics Letters
ISSN: 0003-6951 1077-3118
Published: 2014
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URI: https://cronfa.swan.ac.uk/Record/cronfa37215
first_indexed 2017-11-28T20:13:09Z
last_indexed 2018-02-09T05:30:24Z
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spelling 2017-11-28T15:07:42.4318840 v2 37215 2017-11-28 Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts a18d76438369122184e83fb683d8d787 0000-0002-7528-8649 Deb Roy Deb Roy true false 2017-11-28 EAAS Journal Article Applied Physics Letters 104 12 123106 0003-6951 1077-3118 31 12 2014 2014-12-31 10.1063/1.4869184 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&amp;SrcAuth=ORCID&amp;SrcApp=OrcidOrg&amp;DestLinkType=FullRecord&amp;DestApp=WOS_CPL&amp;KeyUT=WOS:000334078500065&amp;KeyUID=WOS:000334078500065 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University 2017-11-28T15:07:42.4318840 2017-11-28T15:07:42.2446098 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemistry Naresh Kumar 1 Alasdair Rae 2 Deb Roy 0000-0002-7528-8649 3
title Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
spellingShingle Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
Deb Roy
title_short Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
title_full Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
title_fullStr Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
title_full_unstemmed Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
title_sort Accurate measurement of enhancement factor in tip-enhanced Raman spectroscopy through elimination of far-field artefacts
author_id_str_mv a18d76438369122184e83fb683d8d787
author_id_fullname_str_mv a18d76438369122184e83fb683d8d787_***_Deb Roy
author Deb Roy
author2 Naresh Kumar
Alasdair Rae
Deb Roy
format Journal article
container_title Applied Physics Letters
container_volume 104
container_issue 12
container_start_page 123106
publishDate 2014
institution Swansea University
issn 0003-6951
1077-3118
doi_str_mv 10.1063/1.4869184
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Chemistry{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemistry
url http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&amp;SrcAuth=ORCID&amp;SrcApp=OrcidOrg&amp;DestLinkType=FullRecord&amp;DestApp=WOS_CPL&amp;KeyUT=WOS:000334078500065&amp;KeyUID=WOS:000334078500065
document_store_str 0
active_str 0
published_date 2014-12-31T04:15:15Z
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