No Cover Image

Journal article 839 views

High-throughput intermittent-contact scanning probe microscopy

D.R. Sahoo, W. Häberle, A. Sebastian, H. Pozidis, E. Eleftheriou, Deepak Sahoo Orcid Logo

Nanotechnology, Volume: 21, Issue: 7, Start page: 075701

Swansea University Author: Deepak Sahoo Orcid Logo

Full text not available from this repository: check for access using links below.

Published in: Nanotechnology
ISSN: 0957-4484 1361-6528
Published: 2010
Online Access: Check full text

URI: https://cronfa.swan.ac.uk/Record/cronfa32160
Tags: Add Tag
No Tags, Be the first to tag this record!
first_indexed 2017-02-28T13:32:23Z
last_indexed 2018-02-09T05:19:47Z
id cronfa32160
recordtype SURis
fullrecord <?xml version="1.0"?><rfc1807><datestamp>2017-02-28T09:35:16.2280656</datestamp><bib-version>v2</bib-version><id>32160</id><entry>2017-02-28</entry><title>High-throughput intermittent-contact scanning probe microscopy</title><swanseaauthors><author><sid>c7b57876957049ac9718ff1b265fb2ce</sid><ORCID>0000-0002-4421-7549</ORCID><firstname>Deepak</firstname><surname>Sahoo</surname><name>Deepak Sahoo</name><active>true</active><ethesisStudent>false</ethesisStudent></author></swanseaauthors><date>2017-02-28</date><deptcode>SCS</deptcode><abstract/><type>Journal Article</type><journal>Nanotechnology</journal><volume>21</volume><journalNumber>7</journalNumber><paginationStart>075701</paginationStart><publisher/><issnPrint>0957-4484</issnPrint><issnElectronic>1361-6528</issnElectronic><keywords/><publishedDay>31</publishedDay><publishedMonth>12</publishedMonth><publishedYear>2010</publishedYear><publishedDate>2010-12-31</publishedDate><doi>10.1088/0957-4484/21/7/075701</doi><url>http://www.scopus.com/inward/record.url?eid=2-s2.0-74949111613&amp;amp;partnerID=MN8TOARS</url><notes/><college>COLLEGE NANME</college><department>Computer Science</department><CollegeCode>COLLEGE CODE</CollegeCode><DepartmentCode>SCS</DepartmentCode><institution>Swansea University</institution><apcterm/><lastEdited>2017-02-28T09:35:16.2280656</lastEdited><Created>2017-02-28T09:35:15.7600280</Created><path><level id="1">Faculty of Science and Engineering</level><level id="2">School of Mathematics and Computer Science - Computer Science</level></path><authors><author><firstname>D.R.</firstname><surname>Sahoo</surname><order>1</order></author><author><firstname>W.</firstname><surname>H&#xE4;berle</surname><order>2</order></author><author><firstname>A.</firstname><surname>Sebastian</surname><order>3</order></author><author><firstname>H.</firstname><surname>Pozidis</surname><order>4</order></author><author><firstname>E.</firstname><surname>Eleftheriou</surname><order>5</order></author><author><firstname>Deepak</firstname><surname>Sahoo</surname><orcid>0000-0002-4421-7549</orcid><order>6</order></author></authors><documents/><OutputDurs/></rfc1807>
spelling 2017-02-28T09:35:16.2280656 v2 32160 2017-02-28 High-throughput intermittent-contact scanning probe microscopy c7b57876957049ac9718ff1b265fb2ce 0000-0002-4421-7549 Deepak Sahoo Deepak Sahoo true false 2017-02-28 SCS Journal Article Nanotechnology 21 7 075701 0957-4484 1361-6528 31 12 2010 2010-12-31 10.1088/0957-4484/21/7/075701 http://www.scopus.com/inward/record.url?eid=2-s2.0-74949111613&amp;partnerID=MN8TOARS COLLEGE NANME Computer Science COLLEGE CODE SCS Swansea University 2017-02-28T09:35:16.2280656 2017-02-28T09:35:15.7600280 Faculty of Science and Engineering School of Mathematics and Computer Science - Computer Science D.R. Sahoo 1 W. Häberle 2 A. Sebastian 3 H. Pozidis 4 E. Eleftheriou 5 Deepak Sahoo 0000-0002-4421-7549 6
title High-throughput intermittent-contact scanning probe microscopy
spellingShingle High-throughput intermittent-contact scanning probe microscopy
Deepak Sahoo
title_short High-throughput intermittent-contact scanning probe microscopy
title_full High-throughput intermittent-contact scanning probe microscopy
title_fullStr High-throughput intermittent-contact scanning probe microscopy
title_full_unstemmed High-throughput intermittent-contact scanning probe microscopy
title_sort High-throughput intermittent-contact scanning probe microscopy
author_id_str_mv c7b57876957049ac9718ff1b265fb2ce
author_id_fullname_str_mv c7b57876957049ac9718ff1b265fb2ce_***_Deepak Sahoo
author Deepak Sahoo
author2 D.R. Sahoo
W. Häberle
A. Sebastian
H. Pozidis
E. Eleftheriou
Deepak Sahoo
format Journal article
container_title Nanotechnology
container_volume 21
container_issue 7
container_start_page 075701
publishDate 2010
institution Swansea University
issn 0957-4484
1361-6528
doi_str_mv 10.1088/0957-4484/21/7/075701
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Mathematics and Computer Science - Computer Science{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Mathematics and Computer Science - Computer Science
url http://www.scopus.com/inward/record.url?eid=2-s2.0-74949111613&amp;partnerID=MN8TOARS
document_store_str 0
active_str 0
published_date 2010-12-31T03:39:22Z
_version_ 1763751768430215168
score 11.013731