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Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy

O.J Guy, D Doneddu, L Chen, M.R Jennings, M.P Ackland, R Baylis, M.D Holton, P Dunstan, S.P Wilks, P.A Mawby, Owen Guy Orcid Logo

Pages: 1472 - 1477

Swansea University Author: Owen Guy Orcid Logo

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DOI (Published version): 10.1016/j.diamond.2005.11.010

Published: 2006
URI: https://cronfa.swan.ac.uk/Record/cronfa1843
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first_indexed 2013-07-23T11:48:36Z
last_indexed 2018-02-09T04:29:30Z
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spelling 2011-10-01T00:00:00.0000000 v2 1843 2011-10-01 Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy c7fa5949b8528e048c5b978005f66794 0000-0002-6449-4033 Owen Guy Owen Guy true false 2011-10-01 CHEM Journal Article 1472 1477 31 12 2006 2006-12-31 10.1016/j.diamond.2005.11.010 COLLEGE NANME Chemistry COLLEGE CODE CHEM Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 Faculty of Science and Engineering School of Engineering and Applied Sciences - Chemistry O.J Guy 1 D Doneddu 2 L Chen 3 M.R Jennings 4 M.P Ackland 5 R Baylis 6 M.D Holton 7 P Dunstan 8 S.P Wilks 9 P.A Mawby 10 Owen Guy 0000-0002-6449-4033 11
title Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
spellingShingle Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
Owen Guy
title_short Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
title_full Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
title_fullStr Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
title_full_unstemmed Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
title_sort Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
author_id_str_mv c7fa5949b8528e048c5b978005f66794
author_id_fullname_str_mv c7fa5949b8528e048c5b978005f66794_***_Owen Guy
author Owen Guy
author2 O.J Guy
D Doneddu
L Chen
M.R Jennings
M.P Ackland
R Baylis
M.D Holton
P Dunstan
S.P Wilks
P.A Mawby
Owen Guy
format Journal article
container_start_page 1472
publishDate 2006
institution Swansea University
doi_str_mv 10.1016/j.diamond.2005.11.010
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Chemistry{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Chemistry
document_store_str 0
active_str 0
published_date 2006-12-31T03:04:46Z
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score 11.037581

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