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Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal

Kathryn A Whitehead, Dale Rogers, John Colligon, Chris Wright, Joanna Verran, Christopher Wright Orcid Logo

Pages: 44 - 53

Swansea University Author: Christopher Wright Orcid Logo

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DOI (Published version): 10.1016/j.colsurfb.2006.05.003

Published: 2006
URI: https://cronfa.swan.ac.uk/Record/cronfa1823
first_indexed 2013-07-23T11:48:32Z
last_indexed 2018-02-09T04:29:27Z
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spelling 2011-10-01T00:00:00.0000000 v2 1823 2011-10-01 Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal 235e125ac3463e2ee7fc98604bf879ce 0000-0003-2375-8159 Christopher Wright Christopher Wright true false 2011-10-01 EAAS Journal Article 44 53 31 12 2006 2006-12-31 10.1016/j.colsurfb.2006.05.003 COLLEGE NANME Engineering and Applied Sciences School COLLEGE CODE EAAS Swansea University 2011-10-01T00:00:00.0000000 2011-10-01T00:00:00.0000000 Faculty of Science and Engineering School of Engineering and Applied Sciences - Biomedical Engineering Kathryn A Whitehead 1 Dale Rogers 2 John Colligon 3 Chris Wright 4 Joanna Verran 5 Christopher Wright 0000-0003-2375-8159 6
title Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
spellingShingle Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
Christopher Wright
title_short Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
title_full Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
title_fullStr Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
title_full_unstemmed Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
title_sort Use of the atomic force microscope to determine the effect of substratum surface topography on the ease of bacterial removal
author_id_str_mv 235e125ac3463e2ee7fc98604bf879ce
author_id_fullname_str_mv 235e125ac3463e2ee7fc98604bf879ce_***_Christopher Wright
author Christopher Wright
author2 Kathryn A Whitehead
Dale Rogers
John Colligon
Chris Wright
Joanna Verran
Christopher Wright
format Journal article
container_start_page 44
publishDate 2006
institution Swansea University
doi_str_mv 10.1016/j.colsurfb.2006.05.003
college_str Faculty of Science and Engineering
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hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Engineering and Applied Sciences - Biomedical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Engineering and Applied Sciences - Biomedical Engineering
document_store_str 0
active_str 0
published_date 2006-12-31T03:07:16Z
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score 11.089386

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