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Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy

R. J Cobley, R. A Brown, C. J Barnett, T. G. G Maffeis, M. W Penny, Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo

Applied Physics Letters, Volume: 102, Issue: 2, Start page: 023111

Swansea University Authors: Thierry Maffeis Orcid Logo, Richard Cobley Orcid Logo

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DOI (Published version): 10.1063/1.4776705

Published in: Applied Physics Letters
ISSN: 0003-6951
Published: 2013
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URI: https://cronfa.swan.ac.uk/Record/cronfa14274
first_indexed 2013-07-23T12:13:15Z
last_indexed 2018-02-09T04:45:35Z
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spelling 2013-06-10T11:57:32.0819657 v2 14274 2013-09-03 Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy 992eb4cb18b61c0cd3da6e0215ac787c 0000-0003-2357-0092 Thierry Maffeis Thierry Maffeis true false 2ce7e1dd9006164425415a35fa452494 0000-0003-4833-8492 Richard Cobley Richard Cobley true false 2013-09-03 ACEM Journal Article Applied Physics Letters 102 2 023111 0003-6951 31 12 2013 2013-12-31 10.1063/1.4776705 COLLEGE NANME Aerospace, Civil, Electrical, and Mechanical Engineering COLLEGE CODE ACEM Swansea University 2013-06-10T11:57:32.0819657 2013-09-03T06:17:26.0000000 Faculty of Science and Engineering School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering R. J Cobley 1 R. A Brown 2 C. J Barnett 3 T. G. G Maffeis 4 M. W Penny 5 Thierry Maffeis 0000-0003-2357-0092 6 Richard Cobley 0000-0003-4833-8492 7
title Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
spellingShingle Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
Thierry Maffeis
Richard Cobley
title_short Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
title_full Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
title_fullStr Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
title_full_unstemmed Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
title_sort Quantitative analysis of annealed scanning probe tips using energy dispersive x-ray spectroscopy
author_id_str_mv 992eb4cb18b61c0cd3da6e0215ac787c
2ce7e1dd9006164425415a35fa452494
author_id_fullname_str_mv 992eb4cb18b61c0cd3da6e0215ac787c_***_Thierry Maffeis
2ce7e1dd9006164425415a35fa452494_***_Richard Cobley
author Thierry Maffeis
Richard Cobley
author2 R. J Cobley
R. A Brown
C. J Barnett
T. G. G Maffeis
M. W Penny
Thierry Maffeis
Richard Cobley
format Journal article
container_title Applied Physics Letters
container_volume 102
container_issue 2
container_start_page 023111
publishDate 2013
institution Swansea University
issn 0003-6951
doi_str_mv 10.1063/1.4776705
college_str Faculty of Science and Engineering
hierarchytype
hierarchy_top_id facultyofscienceandengineering
hierarchy_top_title Faculty of Science and Engineering
hierarchy_parent_id facultyofscienceandengineering
hierarchy_parent_title Faculty of Science and Engineering
department_str School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering{{{_:::_}}}Faculty of Science and Engineering{{{_:::_}}}School of Aerospace, Civil, Electrical, General and Mechanical Engineering - Electronic and Electrical Engineering
document_store_str 0
active_str 0
published_date 2013-12-31T12:29:43Z
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score 10.807269

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