Search: '"IEEE Journal of the Electron Devices Society"'

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FinFET Versus Gate-All-Around Nanowire FET: Performance, Scaling, and Variability / Guillermo Indalecio, Antonio J. Garcia-Loureiro, Muhammad A. Elmessary, Natalia Seoane

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Spatial Sensitivity of Silicon GAA Nanowire FETs under Line Edge Roughness Variations / Guillermo Indalecio, Antonio J. Garcia-Loureiro, Muhammad A. Elmessary, Natalia Seoane

Swansea University Author: Karol Kalna
Published in IEEE Journal of the Electron Devices Society (2018)
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Heteroepitaxial Beta-Ga2O3 on 4H-SiC for an FET With Reduced Self Heating / Stephen A. O. Russell, Amador Perez-Tomas, Christopher F. McConville, Craig A. Fisher, Dean P. Hamilton, et al

Swansea University Author: Mike Jennings
Published in IEEE Journal of the Electron Devices Society (2017)
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