Ghosh, S., Spiridon, B. F., Toon, M., Hinz, A., Fairclough, S. M., Guilhabert, B. J. E., . . . Oliver, R. A. (2021). Method for inferring the mechanical strain of GaN-on-Si epitaxial layers using optical profilometry and finite element analysis. Optical Materials Express, 11(6), p. 1643. doi:10.1364/ome.418728

Ghosh, Saptarsi, et al. "Method for Inferring the Mechanical Strain of GaN-on-Si Epitaxial Layers Using Optical Profilometry and Finite Element Analysis." Optical Materials Express 11, no. 6 (2021): 1643.

Ghosh, Saptarsi, et al. "Method for Inferring the Mechanical Strain of GaN-on-Si Epitaxial Layers Using Optical Profilometry and Finite Element Analysis." Optical Materials Express 11.6 (2021): 1643.