Cobley, R., Wilks, S., Teng, V., Brown, R., & Rees, P. (2010). Surface defects in semiconductor lasers studied with cross-sectional scanning tunneling microscopy. Applied Surface Science, 256(19), p. 5736. doi:10.1016/j.apsusc.2010.03.089

Cobley, Richard, Steve Wilks, Vincent Teng, Rowan Brown, and Paul Rees. "Surface Defects in Semiconductor Lasers Studied With Cross-sectional Scanning Tunneling Microscopy." Applied Surface Science 256, no. 19 (2010): 5736.

Cobley, Richard, et al. "Surface Defects in Semiconductor Lasers Studied With Cross-sectional Scanning Tunneling Microscopy." Applied Surface Science 256.19 (2010): 5736.