Jennings, M., Li, F., Song, Q., Perez-Tomas, A., Shah, V., Sharma, Y., . . . Mawby, P. (2020). A First Evaluation of Thick Oxide 3C-SiC MOS Capacitors Reliability. IEEE Transactions on Electron Devices, 67(1), pp. 237-242. doi:10.1109/ted.2019.2954911

Jennings, Mike, et al. "A First Evaluation of Thick Oxide 3C-SiC MOS Capacitors Reliability." IEEE Transactions On Electron Devices 67, no. 1 (2020): 237-242.

Jennings, Mike, et al. "A First Evaluation of Thick Oxide 3C-SiC MOS Capacitors Reliability." IEEE Transactions On Electron Devices 67.1 (2020): 237-242.