Jennings, M., Hamilton, D. P., Perez-Tomas, A., Russell, S. A. O., Hindmarsh, S. A., Fisher, C. A., & Mawby, P. A. (2017). High-Temperature Electrical and Thermal Aging Performance and Application Considerations for SiC Power DMOSFETs. IEEE Transactions on Power Electronics, 32(10), pp. 7967-7979. doi:10.1109/TPEL.2016.2636743

Jennings, Mike, Dean P. Hamilton, Amador Perez-Tomas, Stephen A. O. Russell, Steven A. Hindmarsh, Craig A. Fisher, and Philip A. Mawby. "High-Temperature Electrical and Thermal Aging Performance and Application Considerations for SiC Power DMOSFETs." IEEE Transactions On Power Electronics 32, no. 10 (2017): 7967-7979.

Jennings, Mike, et al. "High-Temperature Electrical and Thermal Aging Performance and Application Considerations for SiC Power DMOSFETs." IEEE Transactions On Power Electronics 32.10 (2017): 7967-7979.