John, G. D. (2004). Secondary ion mass spectrometry and resonant ionisation mass spectrometry studies of nickel contacts to silicon carbide.
Chicago Style CitationJohn, Gareth David. Secondary Ion Mass Spectrometry and Resonant Ionisation Mass Spectrometry Studies of Nickel Contacts to Silicon Carbide. 2004.
MLA CitationJohn, Gareth David. Secondary Ion Mass Spectrometry and Resonant Ionisation Mass Spectrometry Studies of Nickel Contacts to Silicon Carbide. 2004.
Warning: These citations may not always be 100% accurate.