Jewell, E., Claypole, T., & Gethin, D. (2005). Characterisation methods for printed thin film electronics. Annapolis, USA: TAGA / IMAPS conference “Printing an Intelligent Future.
Chicago Style CitationJewell, Eifion, Tim Claypole, and David Gethin. Characterisation Methods for Printed Thin Film Electronics. Annapolis, USA: TAGA / IMAPS conference “Printing an Intelligent Future, 2005.
MLA CitationJewell, Eifion, Tim Claypole, and David Gethin. Characterisation Methods for Printed Thin Film Electronics. Annapolis, USA: TAGA / IMAPS conference “Printing an Intelligent Future, 2005.
Warning: These citations may not always be 100% accurate.