Roy, D., Mignuzzi, S., Kumar, N., Brennan, B., Gilmore, I. S., Richards, D., & Pollard, A. J. (2015). Probing individual point defects in graphene via near-field Raman scattering. Nanoscale, 7(46), pp. 19413-19418. doi:10.1039/c5nr04664e

Roy, Deb, Sandro Mignuzzi, Naresh Kumar, Barry Brennan, Ian S. Gilmore, David Richards, and Andrew J. Pollard. "Probing Individual Point Defects in Graphene Via Near-field Raman Scattering." Nanoscale 7, no. 46 (2015): 19413-19418.

Roy, Deb, et al. "Probing Individual Point Defects in Graphene Via Near-field Raman Scattering." Nanoscale 7.46 (2015): 19413-19418.