Lord, A., Evans, J. E., Barnett, C. J., Allen, M. W., Barron, A., & Wilks, S. P. (2017). Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS. Journal of Physics: Condensed Matter, 29(38), p. 384001. doi:10.1088/1361-648X/aa7dc8

Lord, Alex, Jonathan E. Evans, Chris J. Barnett, Martin W. Allen, Andrew Barron, and Steve P. Wilks. "Surface Sensitivity of Four-probe STM Resistivity Measurements of Bulk ZnO Correlated to XPS." Journal of Physics: Condensed Matter 29, no. 38 (2017): 384001.

Lord, Alex, et al. "Surface Sensitivity of Four-probe STM Resistivity Measurements of Bulk ZnO Correlated to XPS." Journal of Physics: Condensed Matter 29.38 (2017): 384001.