Kalna, K., Ubochi, B., Faramehr, S., Ahmeda, K., & Igić, P. (2017). Operational frequency degradation induced trapping in scaled GaN HEMTs. Microelectronics Reliability, 71, pp. 35-40. doi:10.1016/j.microrel.2017.02.008

Kalna, Karol, Brendan Ubochi, Soroush Faramehr, Khaled Ahmeda, and Petar Igić. "Operational Frequency Degradation Induced Trapping in Scaled GaN HEMTs." Microelectronics Reliability 71 (2017): 35-40.

Kalna, Karol, et al. "Operational Frequency Degradation Induced Trapping in Scaled GaN HEMTs." Microelectronics Reliability 71 (2017): 35-40.