Hooper, K., Lee, H. K. H., Newman, M., Meroni, S., Baker, J., Watson, T., & Tsoi, W. C. (2017). Probing the degradation and homogeneity of embedded perovskite semiconducting layers in photovoltaic devices by Raman spectroscopy. Physical Chemistry Chemical Physics, 19(7), pp. 5246-5253. doi:10.1039/c6cp05123e

Hooper, Katherine, H. K. H. Lee, Michael Newman, Simone Meroni, Jenny Baker, Trystan Watson, and Wing Chung Tsoi. "Probing the Degradation and Homogeneity of Embedded Perovskite Semiconducting Layers in Photovoltaic Devices By Raman Spectroscopy." Physical Chemistry Chemical Physics 19, no. 7 (2017): 5246-5253.

Hooper, Katherine, et al. "Probing the Degradation and Homogeneity of Embedded Perovskite Semiconducting Layers in Photovoltaic Devices By Raman Spectroscopy." Physical Chemistry Chemical Physics 19.7 (2017): 5246-5253.