Teng, V., Wilks, S., Teng, K., Dunstan, P., & Williams, R. (2002). The passivation of atomic scale defects present on III–V semiconductor laser facets: An STM/STS investigation. Applied Surface Science, 190(1-4), pp. 467-474. doi:10.1016/S0169-4332(01)00920-5

Teng, Vincent, S.P Wilks, K.S Teng, P.R Dunstan, and R.H Williams. "The Passivation of Atomic Scale Defects Present On III–V Semiconductor Laser Facets: An STM/STS Investigation." Applied Surface Science 190, no. 1-4 (2002): 467-474.

Teng, Vincent, et al. "The Passivation of Atomic Scale Defects Present On III–V Semiconductor Laser Facets: An STM/STS Investigation." Applied Surface Science 190.1-4 (2002): 467-474.