Wilks, S., Cobley, R. J., Teng, K. S., Brown, M. R., Wilks, S. P., Rees, P., . . . Rees, P. (2007). Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy. Applied Physics Letters, 91(8), p. 081119. doi:10.1063/1.2775049

Wilks, Steve, et al. "Direct Real-time Observation of Catastrophic Optical Degradation in Operating Semiconductor Lasers Using Scanning Tunneling Microscopy." Applied Physics Letters 91, no. 8 (2007): 081119.

Wilks, Steve, et al. "Direct Real-time Observation of Catastrophic Optical Degradation in Operating Semiconductor Lasers Using Scanning Tunneling Microscopy." Applied Physics Letters 91.8 (2007): 081119.