Xie, X., & Xie, X. (2008). A review of recent advances in surface defect detection using texture analysis techniques. Electronic Letters on Computer Vision and Image Analysis, 7(3), pp. 1-25. doi:10.5565/rev/elcvia.268
Chicago Style CitationXie, Xianghua, and X. Xie. "A Review of Recent Advances in Surface Defect Detection Using Texture Analysis Techniques." Electronic Letters On Computer Vision and Image Analysis 7, no. 3 (2008): 1-25.
MLA CitationXie, Xianghua, and X. Xie. "A Review of Recent Advances in Surface Defect Detection Using Texture Analysis Techniques." Electronic Letters On Computer Vision and Image Analysis 7.3 (2008): 1-25.
Warning: These citations may not always be 100% accurate.